Description: JEOL S20A-1193-0200A/02 Detector PCB Card JVME-AIC JWS-2000 SEM Working Spare Inventory # CONF-1292 Part No: S20A-1193-0200A/02 Model No: JVME-AIC Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System Made in Japan This JEOL S20A-1193-0200A/02 Detector PCB Card is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 14"x14"x14" @ 8 lbs. Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale. For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary. Items are sold with a 90-Day Satisfaction Guarantee Lister 12
Price: 659.19 USD
Location: Albuquerque, New Mexico
End Time: 2025-01-12T23:39:11.000Z
Shipping Cost: N/A USD
Product Images
Item Specifics
Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 60 Days
Refund will be given as: Money Back
Country/Region of Manufacture: Japan
System/Tool: JEOL JWS-2000 Wafer Defect Review SEM
Model: JVME-AIC
Category: Semiconductor Tools Systems and Components
Inventory #: CONF-1292
MPN: S20A-1193-0200A/02
Brand: JEOL
