Description: Jeol JSM-840F FEG SEM Scan Rotation SM-40080 Scanning Electron Microscope high-performance Jeol JSM-840F FEG SEM Scan Rotation SM-40080 Scanning Electron Microscope. This cutting-edge scientific instrument offers exceptional imaging capabilities and advanced features to meet the needs of researchers, scientists, and professionals in various fields. The Jeol JSM-840F FEG SEM is equipped with a Field Emission Gun (FEG) that produces an electron beam of outstanding brightness and stability. This enables highly detailed and high-resolution imaging of samples with exceptional clarity and accuracy. Whether you're studying nanomaterials, biological specimens, or conducting materials analysis, this SEM provides the precision and resolution you require. The SM-40080 Scan Rotation system allows for precise and controlled sample manipulation during imaging. You can easily rotate and tilt the sample to capture multiple angles and perspectives, enabling comprehensive analysis and detailed examination of your samples. Key Features: Field Emission Gun (FEG): Delivers a highly stable and bright electron beam for superior imaging performance. High-Resolution Imaging: Capture intricate details with exceptional clarity and precision. SM-40080 Scan Rotation System: Enables easy and controlled sample rotation and tilt for comprehensive analysis. Versatile Application: Suitable for various research fields, such as materials science, nanotechnology, biology, and more. User-Friendly Interface: Intuitive controls and software make operating the microscope straightforward and efficient. Please note that this Jeol JSM-840F FEG SEM Scan Rotation SM-40080 Scanning Electron Microscope is a pre-owned unit in excellent working condition.
Price: 75 USD
Location: Boulder Creek, California
End Time: 2024-08-12T17:02:28.000Z
Shipping Cost: 18.4 USD
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All returns accepted: ReturnsNotAccepted
Brand: JEOL
