Description: Cluster Secondary Ion Mass Spectrometry : Principles and Applications, Hardcover by Mahoney, Christine M. (EDT), ISBN 0470886056, ISBN-13 9780470886052, Brand New, Free shipping in the US Physicists and chemists in the US and Europe explain an imaging technology that has become popular for its ability to characterize surface and in-depth compositions of molecular species with minimal damage, its excellent spatial (100 nanometers or less and depth of five nanometers) resolutions, and its increased sensitivities for bioimaging applications. Among the topics are theoretical insights into cluster secondary ion mass spectrometry (cluster SIMS), surface analysis of organic materials with polyatomic primary ion sources, three-dimensional imaging with cluster ion beams, and cluster SIMS for the depth profiling of semiconductors and metals. Annotation ©2013 Book News, Inc., Portland, OR ()
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Book Title: Cluster Secondary Ion Mass Spectrometry : Principles and Applicat
Author: Mahoney, Christine M. (EDT)
Language: english
