Description: Applied Scanning Probe Methods XI Please note: this item is printed on demand and will take extra time before it can be dispatched to you (up to 20 working days). Scanning Probe Microscopy Techniques Author(s): Bharat Bhushan, Harald Fuchs Format: Paperback Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K ISBN-13: 9783642098697, 978-3642098697 Synopsis "The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. " This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information-knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2-4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth.
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Book Title: Applied Scanning Probe Methods XI
Number of Pages: 236 Pages
Language: English
Publication Name: Applied Scanning Probe Methods Xi: Scanning Probe Microscopy Techniques
Publisher: Springer-Verlag Berlin AND Heidelberg Gmbh & Co. KG
Publication Year: 2010
Subject: Engineering & Technology, Chemistry, Science, Physics
Item Height: 235 mm
Item Weight: 450 g
Type: Textbook
Author: Harald Fuchs, Bharat Bhushan
Subject Area: Mechanical Engineering, Nanotechnology
Series: Nanoscience and Technology
Item Width: 155 mm
Format: Paperback
