Description: Note: Any images shown are stock photographs and product may differ from what is shown. You are purchasing a Good copy of 'Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)'Condition Notes: Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can included some highlighting and writing, page and cover creases as well as other types visible wear.
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Release Year: 2006
Book Title: Applied Scanning Probe Methods VI: Characterization (NanoScien...
Number of Pages: Xlv, 338 Pages
Publication Name: Applied Scanning Probe Methods VI : Characterization
Language: English
Publisher: Springer Berlin / Heidelberg
Subject: Nanoscience, Materials Science / Thin Films, Surfaces & Interfaces, Electron Microscopes & Microscopy, Nanotechnology & Mems, Microscopes & Microscopy
Publication Year: 2006
Type: Textbook
Item Weight: 26.3 Oz
Item Length: 9.3 in
Subject Area: Technology & Engineering, Science
Author: Harald Fuchs
Item Width: 6.1 in
Series: Nanoscience and Technology Ser.
Format: Hardcover
