Description: Applied Scanning Probe Methods IX : Characterization, Hardcover by Bhushan, Bharat (EDT); Fuchs, Harald (EDT); Tomitori, Masahiko (EDT), ISBN 3540740821, ISBN-13 9783540740827, Like New Used, Free shipping in the US The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
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Book Title: Applied Scanning Probe Methods IX : Characterization
Number of Pages: Lix, 387 Pages
Language: English
Publication Name: Applied Scanning Probe Methods IX : Characterization
Publisher: Springer Berlin / Heidelberg
Subject: Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical, Nanotechnology & Mems, Microscopes & Microscopy
Publication Year: 2008
Item Height: 0.3 in
Item Weight: 29.4 Oz
Type: Textbook
Subject Area: Technology & Engineering, Science
Item Length: 9.3 in
Author: H. Fuchs, Bharat Bhushan
Item Width: 6.1 in
Series: Nanoscience and Technology Ser.
Format: Hardcover
